3144 Slices
Medium 9781601323224

Packet Loss Resilience Lighting Control for Wireless Sensor Networks

Hamid R. Arabnia, Leonidas Deligiannidis, George Jandieri, Ashu M. G. Solo, Fernando G. Tinetti CSREA Press PDF

Int'l Conf. Wireless Networks | ICWN'14 |

35

Packet Loss Resilience Lighting Control for Wireless Sensor Networks

Yushi Uchimura1 , Hiroto Aida2 , Ryoga Okunishi1 , Yo Motoya1 , and Mitsunori Miki2

1 Graduate School of Science and Engineering, Doshisha University

2 Department of Science and Engineering, Doshisha University,

1-3 Tataramiyakodani, Kyotanabe-shi, Kyoto, 610-0394 Japan

Abstract— The use of wireless sensor networks in offices for the purpose of conserving power has been attracting attention. At the same time, we are conducting research and development of an Intelligent Lighting System that targets offices and realize the illuminance required by the workers. By using a wireless sensor network in the Intelligent

Lighting System, we are able to improve the ease of installing illuminance meters. However, in wireless network sensors that use many low power wireless signals, the potential for packet loss due to radio wave conditions exists. In this study, multiple lighting control algorithms that enable convergence on the required illuminance, even if packet loss occurs, are proposed. Moreover, the proposed algorithm was evaluated under multiple environments in which packet loss was generated. By using the Estimation Algorithm, illuminance convergence equivalent to cases involving no packet loss was realized even in environments with a high packet loss rate.

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Medium 9781601322616

Session Bioinformatics

Hamid R. Arabnia; Leonidas Deligiannidis; Ashu M. G. Solo; and Fernando G. Tinetti (Editors) Mercury Learning and Information PDF
Medium 9781601322609

Lights on the Impact of Requirements Interdependencies on Priorities during Release Planning Decisions

Hamid R. Arabnia, Leonidas Deligiannidis, George Jandieri, Vince Schmidt, Ashu M.G. Solo, Fernando G. Tinetti CSREA Press PDF

324

Int'l Conf. Software Eng. Research and Practice | SERP'13 |

Lights on the Impact of Requirements

Interdependencies on Priorities during Release

Planning Decisions

Bassey Isong1, Obeten Ekabua2, and Ifeoma Ohaeri2

Department of Computer Science, University of Venda, Thohoyandou, Limpopo, South Africa

2

Department of Computer Science, North-West University, Mmabatho, Mafikeng, South Africa

1

Abstract - In market-driven software development, software release planning is both crucial and complex activity with a significant impact on the success or failure of software product development. However, the task of scheduling an optimal set of requirements for a particular release is not as easy as expected. This is because requirements prioritization is crippled by interdependencies. Consequently, release planning decisions are thwarted, prioritization is difficult, and interdependencies are complex and fuzzy. Furthermore, not much has been known about the nature of requirements interdependencies in release planning perspective in literature. Therefore, our objective in this paper is to bring into light the impact of interdependencies on priority of requirement and their complexity nature. In addition, an approach for intermediate representation of interdependencies is proposed.

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Medium 9781601322364

Allocation of NBTI Aging Sensors for Circuit Failure Prediction

Hamid R. Arabnia, Leonidas Deligiannidis, Ashu M. G. Solo, Fernando G. Tinetti CSREA Press PDF

Int'l Conf. Computer Design | CDES'13 |

3

Allocation of NBTI Aging Sensors for Circuit Failure Prediction

Samir Mahaboob Khan Kagadkar and Hussain Al-Asaad

Department of Electrical and Computer Engineering,

University of California, Davis

Abstract— Negative bias temperature instability (NBTI) is a critical device reliability concern in nanometer-scale

CMOS processes. We review the degradation effects of this phenomenon and present techniques to measure and combat NBTI aging. Such techniques involve the insertion of specialized aging sensors and their use in self-correcting dynamic reliability management systems. We propose a novel approach to optimize the allocation of such aging sensors to minimize overhead.

Keywords: Integrated Circuit (IC) reliability, Circuit failure prediction, Negative Bias Temperature Instability (NBTI)

1. Introduction

Engineers working on the design of modern integrated circuits (ICs) fabricated in nanometer-scale technologies are in the unenviable position of having to face a plethora of issues that were benign in the past. Mounting parametric variability, radiation-induced soft errors and time-dependent device degradation make transistors increasingly unreliable components. A generation of engineers is realizing that hardware failures from these unreliable components are a distinctly realistic possibility.

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Medium 9781601323262

Session - Big Data And Data Analytics + Related Technologies and Methods

Hamid R. Arabnia, Lou D'Alotto, Hiroshi Ishii, Minoru Ito, Kazuki Joe, Hiroaki Nishikawa, Georgios Sirakoulis, William Spataro, Giuseppe A. Trunfio, George A. Gravvanis, George Jandieri, Ashu M. G. Solo, Fernando G. Tinetti CSREA Press PDF

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