113 Slices
Medium 9781601323248

Similarity Measures for Fingerprint Matching

Hamid R. Arabnia, Leonidas Deligiannidis Joan Lu, Fernando G. Tinetti, Jane You, George Jandieri, Gerald Schaefer, and Ashu M.G. Solo CSREA Press PDF

Int'l Conf. IP, Comp. Vision, and Pattern Recognition | IPCV'14 |

89

Similarity Measures for Fingerprint Matching

Kareem Kamal A.Ghany1, Aboul Ella Hassanien2 and Gerald Schaefer3

1 Faculty of Computers and Information, Beni Suef University, Egypt

2 Faculty of Computers and Information, Cairo University, Egypt

3 Department of Computer Science, Loughborough University, U.K.

Abstract— In this paper, we investigate different distance metrics for measuring the similarity between fingerprint templates. In particular, we apply several of them during the matching phase of a fingerprint system, and evaluate the obtained results. Our experiments show the Dice coefficient to give the most convincing results with a matching score of

93%, a false rejection rate of 0.04 and a false acceptance rate of 0.006.

Keywords: Fingerprint matching, similarity measure, distance,

Dice coefficient.

1. Introduction

Concepts of similarity and distance are important in many applications. They are for example necessary to measure the similarity of different objects, and thus form an essential part in many pattern recognition applications that involve clustering, classification, recognition, or retrieval. With a large number of similarity measures having been introduced in the literature, selecting an appropriate one for a particular task is crucial, since the success of the related application may depend critically on this choice. Similarity measures vary depending on the data types used [1].

See All Chapters
Medium 9781601323248

Session - Pattern Recognition, Image Retrieval Methods, Image Feature Extraction and feature Mapping, Image Segmentation, Edge Detection

Hamid R. Arabnia, Leonidas Deligiannidis Joan Lu, Fernando G. Tinetti, Jane You, George Jandieri, Gerald Schaefer, and Ashu M.G. Solo CSREA Press PDF
Medium 9781601323248

Session - image and Signal Processing Applications and Novel Algorithms

Hamid R. Arabnia, Leonidas Deligiannidis Joan Lu, Fernando G. Tinetti, Jane You, George Jandieri, Gerald Schaefer, and Ashu M.G. Solo CSREA Press PDF
Medium 9781601323248

Digital Image Processing in Surface Engineering Quality Control

Hamid R. Arabnia, Leonidas Deligiannidis Joan Lu, Fernando G. Tinetti, Jane You, George Jandieri, Gerald Schaefer, and Ashu M.G. Solo CSREA Press PDF

454

Int'l Conf. IP, Comp. Vision, and Pattern Recognition | IPCV'14 |

Digital Image Processing in Surface Engineering

Quality Control

E. Sheybani, S. Garcia, G. Javidi

Virginia State University, Petersburg, VA 23834

Abstract - Ability to measure the surface quality in realtime has many applications in manufacturing automation and product optimization, especially in processes in which the surface qualities such as roughness, grain size, thickness of coding, impurities size and distribution, hardness, and other mechanical properties are of importance. Surface analysis in manufacturing environments requires specialized filtering techniques. Due to the immense effect of rough environment and corruptive parameters, it is often impossible to evaluate the quality of a surface that has undergone various grades of processing. This research aims at providing image processing tools for comparison and assessment of a surface processed under different grades of a manufacturing process all the way up to optimal processing. The algorithm used is capable of performing this comparison analytically and quantitatively at a low computational cost (real-time) and high efficiency. The parameters used for comparison are the degree of blurriness and the amount of various types of noise associated with the surface image. Based on a heuristic analysis of these parameters the algorithm assesses the surface image and quantifies the quality of the image by characterizing important aspects of human visual quality.

See All Chapters
Medium 9781601323248

Session - Posters and Short Papers

Hamid R. Arabnia, Leonidas Deligiannidis Joan Lu, Fernando G. Tinetti, Jane You, George Jandieri, Gerald Schaefer, and Ashu M.G. Solo CSREA Press PDF

See All Slices